Phase measurement method using interferometry technique

Lee, Kean Yew. (2008) Phase measurement method using interferometry technique. [Final Year Project Report] (Unpublished)

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Abstract

There are many types of methods to detect and measure the surface of a material. One of these is an interferometry method. This technique is widely applied due to the fact that it is a non-destructive and non-intrusive method whereby it makes no changes and contacting work to the surface of the material. This work describes the construction and testing of the Michelson interferometer. The method employs an optical technique using He-Ne laser to illuminate the sample. This method enables various parameters such as deformation, strain, refractive index, and surface profile to be obtained. Michelson interferometer is chosen because it is the easiest and the most common type of interferometer. The laser used for the interferometer is the He-Ne laser at 632.8nm wavelength. Superposition occurred when the laser from the mirror and the specimen are reflected and recombined. The superposition of the lasers, known as fringes, is captured by a Charged Coupled Device (CCD). This image is known as interferogram.

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