Norhuzaimin, Julai and Ahmed Mohamed, Ahmed Haidar and Abdul Rahman, Kram (2018) The analysis of soft error in c-elements. Indonesian Journal of Electrical Engineering and Computer Science, 10 (3). pp. 1013-1022. ISSN 25024752
![[img]](http://ir.unimas.my/style/images/fileicons/text.png) |
PDF
The analysis of soft error in c-elements (abstract).pdf Download (66kB) |
Abstract
Soft errors are a serious concern in state holders as it can cause temporarily malfunction of the circuit. C-element is one of the state holders that is used widely in the asynchronous circuit. In this paper, the investigation will focus on the vulnerability of two types of C-element towards soft errors. A framework has been proposed for the rate of error due to neutron spectrum energy that can cause failure in the state holder. Effective analysis has been conducted on two different C-elements at different nodes by using UMC90 nm technology and 180nm technology. Based on the vulnerability data, a method for assessing vulnerability on a different implementation of C-elements has been developed. From the obtained data, it can be concluded that SIL is more resistant towards soft errors. © 2018 Institute of Advanced Engineering and Science. All rights reserved.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | Asynchronous circuit, C-Elements, Low power, Single event upset, Soft error, unimas, university, universiti, Borneo, Malaysia, Sarawak, Kuching, Samarahan, ipta, education, research, Universiti Malaysia Sarawak |
| Subjects: | Q Science > QA Mathematics > QA75 Electronic computers. Computer science |
| Divisions: | Academic Faculties, Institutes and Centres > Faculty of Engineering Faculties, Institutes, Centres > Faculty of Engineering |
| Depositing User: | Ibrahim |
| Date Deposited: | 20 Apr 2018 00:59 |
| Last Modified: | 31 Jul 2023 07:40 |
| URI: | http://ir.unimas.my/id/eprint/20169 |
Actions (For repository members only: login required)
 |
View Item |
