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Adriana, Ganum and Dayang Nurfatimah, Awang Iskandar and Phei Chin, Lim and Ahmad Hadinata, Fauzi (2022) Detection of Monocrystalline Silicon Wafer Defects Using Deep Transfer Learning. Journal of Telecommunications and Information Technology, 1. pp. 34-42. ISSN 1509-4553