The analysis of soft error in c-elements

Norhuzaimin, Bin Julai and Ahmed M.A., Haidar and Abdul Rahman, Kram (2018) The analysis of soft error in c-elements. Indonesian Journal of Electrical Engineering and Computer Science, 10 (3). pp. 1013-1022. ISSN 25024752

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Abstract

Soft errors are a serious concern in state holders as it can cause temporarily malfunction of the circuit. C-element is one of the state holders that is used widely in the asynchronous circuit. In this paper, the investigation will focus on the vulnerability of two types of C-element towards soft errors. A framework has been proposed for the rate of error due to neutron spectrum energy that can cause failure in the state holder. Effective analysis has been conducted on two different C-elements at different nodes by using UMC90 nm technology and 180nm technology. Based on the vulnerability data, a method for assessing vulnerability on a different implementation of C-elements has been developed. From the obtained data, it can be concluded that SIL is more resistant towards soft errors. © 2018 Institute of Advanced Engineering and Science. All rights reserved.

Item Type: Article
Uncontrolled Keywords: Asynchronous circuit, C-Elements, Low power, Single event upset, Soft error, unimas, university, universiti, Borneo, Malaysia, Sarawak, Kuching, Samarahan, ipta, education, research, Universiti Malaysia Sarawak
Subjects: Q Science > QA Mathematics > QA75 Electronic computers. Computer science
Divisions: Academic Faculties, Institutes and Centres > Faculty of Engineering
Depositing User: Ibrahim
Date Deposited: 20 Apr 2018 00:59
Last Modified: 20 Jun 2019 06:59
URI: http://ir.unimas.my/id/eprint/20169

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