The Impact of Soft Error on C-Elements Due to Process Corner Variation and Temperature

Norhuzaimin, Julai (2015) The Impact of Soft Error on C-Elements Due to Process Corner Variation and Temperature. Journal of Applied Science & Process Engineering, 2 (2). pp. 83-96. ISSN 2289-7771

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Abstract

This paper presents current injection resemble single event upset (SEU) current at the vulnerable nodes on different configurations of C-elements under two different scenarios: process corner and temperature. The objectives are to identify the vulnerable nodes due to SEU and to find the critical charges needed to flip the output from low to high (0-1) and high to low (1-0) on different configurations of C-elements. The comparisons of C-elements in term of the resistivity toward soft error are presented.

Item Type: E-Article
Uncontrolled Keywords: Soft Error,Process Variation, Temperature, unimas, university, universiti, Borneo, Malaysia, Sarawak, Kuching, Samarahan, ipta, education, research, Universiti Malaysia Sarawak
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Academic Faculties, Institutes and Centres > Faculty of Engineering
Depositing User: Karen Kornalius
Date Deposited: 07 Oct 2016 03:12
Last Modified: 07 Oct 2016 03:12
URI: http://ir.unimas.my/id/eprint/13739

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