Effect of Lightning Surge in AC Power and Telecommunication Lines for Electrical Devices

ARIEF, Yanuar Zulardiansyah and Jalaluddin, Abu Arif and Saad, Mohd Hafiez Izzwan and Gurusamy, Lakshmanan and Eteruddin, Hamzah (2020) Effect of Lightning Surge in AC Power and Telecommunication Lines for Electrical Devices. In: 2020 13th International UNIMAS Engineering Conference (EnCoN 2020), 27 - 28 October 2020, UNIVERSITAS MALAYSIA SARAWAK (UNIMAS).

[img] PDF
Encon2020-lightning surge-yanuar.pdf

Download (631kB)
Official URL: https://ieeexplore.ieee.org/document/9299332/autho...

Abstract

Lightning surge phenomenon has been recognized as one of a threat to electrical and electronics devices. This event can cause degradation to the devices performance and at high energy can cause the total failure in devices operation. This research work objective is to observe and monitor the effect of lightning surge to electrical devices especially through their power lines and telecommunication lines port. The surge immunity test was conducted using lightning surge simulator to evaluate the immunity of electrical equipment such as multifunction printer, laser fax and integrated telephone systems to ensure them continues reliability operation. Variable voltage values have been injected to electrical devices in an increasing value up to 15 kV or until the devices cannot withstand the voltage and start to degrade, temporary lost function and totally lost function. The devices performance and behavior has been monitored at the normal performance until abnormality performance has been observed and amount of voltage value at that time were recorded for analysis purpose. From this experiment, the high functional devices such as multi-function printer had the lowest immunity to the surge value followed by laser fax and lastly is integrated telephone systems. It was shown that the degradation and damage would occur if there were some narrow coincidence between the phase angle of waveform and superposition of surge. In this case, the frequently occur at phase angle of 90° and 270°, respectively. The results revealed that the worst and high probability for damage to occur towards coupling/decoupling network is at common mode compare to differential mode (L-PE & N-PE).

Item Type: Proceeding (Paper)
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Academic Faculties, Institutes and Centres > Faculty of Engineering
Faculties, Institutes, Centres > Faculty of Engineering
Depositing User: Arief
Date Deposited: 28 Dec 2020 01:35
Last Modified: 28 Dec 2020 01:35
URI: http://ir.unimas.my/id/eprint/33592

Actions (For repository members only: login required)

View Item View Item